Fixed Charge, Interface States and Equivalent Oxide Thickness Correction in the High-k/In0.53Ga0.47As System

Paul Hurley

doi:10.1149/ma2010-02/22/1525

Fixed Charge, Interface States and Equivalent Oxide Thickness Correction in the High-k/In0.53Ga0.47As System

Research output: Contribution to journal › Article › peer-review

Original language	English
Journal	Meeting Abstracts
DOIs	https://doi.org/10.1149/ma2010-02/22/1525
Publication status	Published - 2010

Keywords

Interface (matter)
Materials science
Oxide
Charge (physics)
Fixed charge
Physics
Composite material
Metallurgy
Molecular physics
Quantum mechanics
Capillary number
Capillary action

Access to Document

10.1149/ma2010-02/22/1525

https://openalex.org/W2281868540Licence: CC BY-NC-ND

Cite this

@article{49f310fb9ced47768a6a95d4fc654636,

title = "Fixed Charge, Interface States and Equivalent Oxide Thickness Correction in the High-k/In0.53Ga0.47As System",

keywords = "Interface (matter), Materials science, Oxide, Charge (physics), Fixed charge, Physics, Composite material, Metallurgy, Molecular physics, Quantum mechanics, Capillary number, Capillary action",

author = "Paul Hurley",

year = "2010",

doi = "10.1149/ma2010-02/22/1525",

language = "English",

journal = "Meeting Abstracts",

issn = "1091-8213",

}

TY - JOUR

T1 - Fixed Charge, Interface States and Equivalent Oxide Thickness Correction in the High-k/In0.53Ga0.47As System

AU - Hurley, Paul

PY - 2010

Y1 - 2010

KW - Interface (matter)

KW - Materials science

KW - Oxide

KW - Charge (physics)

KW - Fixed charge

KW - Physics

KW - Composite material

KW - Metallurgy

KW - Molecular physics

KW - Quantum mechanics

KW - Capillary number

KW - Capillary action

U2 - 10.1149/ma2010-02/22/1525

DO - 10.1149/ma2010-02/22/1525

M3 - Article

SN - 1091-8213

JO - Meeting Abstracts

JF - Meeting Abstracts

ER -