Abstract
This paper summarizes reports and opinions presented during a Roundtable Session of the same title at the 13th International Conference on Ion Beam Analysis, Lisbon, 1997. The evolution of new technologies and new fields of research is creating new demands for advanced materials analysis, often at a level not attainable with current techniques. We therefore explore some opportunities for creative development of new or enhanced ion beam techniques to satisfy major predictable needs of the future. In particular, new analytical applications are discussed for the semiconductor industry, for biomedical research, and for advanced research in minerals and geoscience.
| Original language | English |
|---|---|
| Pages (from-to) | 35-41 |
| Number of pages | 7 |
| Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
| Volume | 136-138 |
| DOIs | |
| Publication status | Published - Mar 1998 |
| Externally published | Yes |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
Keywords
- AMS
- Biomedicine
- Future analytical needs
- Geoscience
- Ion microbeams
- Minerals
- PIXE
- Semiconductors
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