Abstract
Interest in Ge has risen sharply since the turn of the century, as it has enabled applications ranging from field-effect-transistors, solar cells, photonics, and sensors. In this paper the state-of-the-art will be reviewed in the areas of (i) dopant behavior and ultrashallow junction performance metrics, (ii) thin-body structure formation, and (iii) contact methodologies in Ge.
| Original language | English |
|---|---|
| Title of host publication | Graphene, Ge/III-V, Nanowires, and Emerging Materials for Post-CMOS Applications 4 |
| Publisher | Electrochemical Society Inc. |
| Pages | 189-201 |
| Number of pages | 13 |
| Edition | 4 |
| ISBN (Electronic) | 9781607683148 |
| ISBN (Print) | 9781566779562 |
| DOIs | |
| Publication status | Published - 2012 |
| Event | 4th International Symposium on Graphene, Ge/III-V and Emerging Materials for Post-CMOS Applications - 221st ECS Meeting - Seattle, WA, United States Duration: 6 May 2012 → 10 May 2012 |
Publication series
| Name | ECS Transactions |
|---|---|
| Number | 4 |
| Volume | 45 |
| ISSN (Print) | 1938-5862 |
| ISSN (Electronic) | 1938-6737 |
Conference
| Conference | 4th International Symposium on Graphene, Ge/III-V and Emerging Materials for Post-CMOS Applications - 221st ECS Meeting |
|---|---|
| Country/Territory | United States |
| City | Seattle, WA |
| Period | 6/05/12 → 10/05/12 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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