Abstract
The temperature dependence of current is investigated experimentally for silicon-germanium (Si-Ge) multi-quantum-well p-i-n devices on Si substrates as uncooled bolometer active layers. Temperature coefficient of resistance values as high as-5.8%/K are recorded. This value is considerably higher than that of even commercial bolometer materials in addition to being well above the previous efforts based on CMOS compatible materials.
| Original language | English |
|---|---|
| Article number | 6022744 |
| Pages (from-to) | 1567-1569 |
| Number of pages | 3 |
| Journal | IEEE Electron Device Letters |
| Volume | 32 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Nov 2011 |
| Externally published | Yes |
Keywords
- Bolometers
- Germanium
- Quantum wells
- Silicon
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