Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures

M. Zhao; W. X. Ni; P. Townsend; S. A. Lynch; D. J. Paul; C. C. Hsu; M. N. Chang

doi:10.1109/GROUP4.2005.1516385

Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures

M. Zhao
, W. X. Ni
, P. Townsend
, S. A. Lynch
, D. J. Paul
, C. C. Hsu
, M. N. Chang

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

Original language	English
Title of host publication	2005 IEEE International Conference on Group IV Photonics
Pages	10-12
Number of pages	3
DOIs	https://doi.org/10.1109/GROUP4.2005.1516385
Publication status	Published - 2005
Externally published	Yes
Event	2005 IEEE International Conference on Group IV Photonics - Antwerp, Belgium Duration: 21 Sep 2005 → 23 Sep 2005

Publication series

Name	2005 IEEE International Conference on Group IV Photonics
Volume	2005

Conference

Conference	2005 IEEE International Conference on Group IV Photonics
Country/Territory	Belgium
City	Antwerp
Period	21/09/05 → 23/09/05

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10.1109/GROUP4.2005.1516385

Cite this

Zhao, M., Ni, W. X., Townsend, P., Lynch, S. A., Paul, D. J., Hsu, C. C., & Chang, M. N. (2005). Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures. In 2005 IEEE International Conference on Group IV Photonics (pp. 10-12). Article 1516385 (2005 IEEE International Conference on Group IV Photonics; Vol. 2005). https://doi.org/10.1109/GROUP4.2005.1516385

@inbook{6286494faf45462b8b40e2276cea7134,

title = "Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures",

author = "M. Zhao and Ni, \{W. X.\} and P. Townsend and Lynch, \{S. A.\} and Paul, \{D. J.\} and Hsu, \{C. C.\} and Chang, \{M. N.\}",

year = "2005",

doi = "10.1109/GROUP4.2005.1516385",

language = "English",

isbn = "0780390709",

series = "2005 IEEE International Conference on Group IV Photonics",

pages = "10--12",

booktitle = "2005 IEEE International Conference on Group IV Photonics",

note = "2005 IEEE International Conference on Group IV Photonics ; Conference date: 21-09-2005 Through 23-09-2005",

}

Zhao, M, Ni, WX, Townsend, P, Lynch, SA, Paul, DJ, Hsu, CC & Chang, MN 2005, Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures. in 2005 IEEE International Conference on Group IV Photonics., 1516385, 2005 IEEE International Conference on Group IV Photonics, vol. 2005, pp. 10-12, 2005 IEEE International Conference on Group IV Photonics, Antwerp, Belgium, 21/09/05. https://doi.org/10.1109/GROUP4.2005.1516385

Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures. / Zhao, M.; Ni, W. X.; Townsend, P. et al.
2005 IEEE International Conference on Group IV Photonics. 2005. p. 10-12 1516385 (2005 IEEE International Conference on Group IV Photonics; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceedings › Chapter › peer-review

TY - CHAP

T1 - Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures

AU - Zhao, M.

AU - Ni, W. X.

AU - Townsend, P.

AU - Lynch, S. A.

AU - Paul, D. J.

AU - Hsu, C. C.

AU - Chang, M. N.

PY - 2005

Y1 - 2005

UR - https://www.scopus.com/pages/publications/33746801152

U2 - 10.1109/GROUP4.2005.1516385

DO - 10.1109/GROUP4.2005.1516385

M3 - Chapter

AN - SCOPUS:33746801152

SN - 0780390709

SN - 9780780390706

T3 - 2005 IEEE International Conference on Group IV Photonics

SP - 10

EP - 12

BT - 2005 IEEE International Conference on Group IV Photonics

T2 - 2005 IEEE International Conference on Group IV Photonics

Y2 - 21 September 2005 through 23 September 2005

ER -

Growth and characterization of strain-symmetried Si/SiGe THz quantum cascade structures

Publication series

Conference

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