Growth of Cr on Ag(001) studied by scanning tunneling microscopy

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Abstract

The growth of ultrathin films of Cr on Ag(001) was studied for deposition temperatures between 285 and 440 K. Film formation was characterised by Scanning Tunneling Microscopy (STM), Auger Electron Spectroscopy (AES) and Low Energy Electron Diffraction (LEED). At room temperature, sub-monolayer deposition results in the formation of irregular monolayer islands. Histogram analysis shows two distinct island heights, one close to the estimated height for a chromium layer on Ag(001) (0.156 nm) and the other close to the Ag(001) layer height (0.205 nm). Compact multi-layer islands are also observed. Higher, broader islands form with increasing deposition temperature. These islands preferentially nucleate on the upper terraces close to descending step edges. The data do not support reports of metastable monolayer growth close to 440 K.

Original languageEnglish
Pages (from-to)395-401
Number of pages7
JournalSurface Science
Volume385
Issue number2-3
DOIs
Publication statusPublished - 10 Aug 1997
Externally publishedYes

Keywords

  • Chromium
  • Epitaxy
  • Growth
  • Low energy single crystal surfaces
  • Metallic films
  • Scanning tunneling microscopy
  • Silver
  • Single crystal surfaces

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