Growth of Cr on Cu(001) studied by scanning tunneling microscopy

  • J. Lawler
  • , R. van der Kraan
  • , H. van Kempen
  • , A. Quinn

Research output: Contribution to journalArticlepeer-review

Abstract

The growth of ultrathin films of Cr on Cu(001) over the temperature range 285-575 K is reported. Film formation has been studied by scanning tunneling microscopy, Auger electron spectroscopy, and low-energy electron diffraction. The growth is found to be three dimensional in character with the formation of irregular multilayer high islands. The deposited chromium becomes more particulate and bulklike in nature with increasing deposition temperature, with the formation of high surface outgrowths. The films are metastable and agglomerate upon annealing at higher temperatures.

Original languageEnglish
Pages (from-to)11159-11163
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume53
Issue number16
DOIs
Publication statusPublished - 1996
Externally publishedYes

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