TY - GEN
T1 - High frequency, single/dual phases, large AC/DC signal power characterization for two phase on-silicon coupled inductors
AU - Femandez, C.
AU - Pavlovic, Z.
AU - Kulkami, S.
AU - McCloskey, P.
AU - O'Mathuna, C.
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/5/17
Y1 - 2017/5/17
N2 - In this work, a new set-up is presented to characterize the large signal electrical parameters of on-Silicon integrated coupled inductors for Power Supply on Chip. The proposed system is suitable to perform the measurements under different large-signal test conditions given by the dc bias current up to 2 A and ac current through one or both windings, with amplitudes ranging from 0 A to 0.5 A at frequencies up to 120 MHz. Since a key issue when measuring at high-frequencies is the error due to the attenuation and time skew between the channels, an additional test is performed to characterize the measurement system and compensate the voltage and current waveforms.
AB - In this work, a new set-up is presented to characterize the large signal electrical parameters of on-Silicon integrated coupled inductors for Power Supply on Chip. The proposed system is suitable to perform the measurements under different large-signal test conditions given by the dc bias current up to 2 A and ac current through one or both windings, with amplitudes ranging from 0 A to 0.5 A at frequencies up to 120 MHz. Since a key issue when measuring at high-frequencies is the error due to the attenuation and time skew between the channels, an additional test is performed to characterize the measurement system and compensate the voltage and current waveforms.
KW - Impedance measurement
KW - Integrated magnetics
KW - Large signal testing
KW - Thinfilm inductors
UR - https://www.scopus.com/pages/publications/85020002220
U2 - 10.1109/APEC.2017.7931048
DO - 10.1109/APEC.2017.7931048
M3 - Conference proceeding
AN - SCOPUS:85020002220
T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC
SP - 2488
EP - 2493
BT - 2017 IEEE Applied Power Electronics Conference and Exposition, APEC 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 32nd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2017
Y2 - 26 March 2017 through 30 March 2017
ER -