High-performance MIM capacitors using novel PMNT Thin films

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Abstract

High-performance metalinsulatormetal (MIM) capacitors using novel Pb(Mg0.33Nb0.67)0.65Ti0.35O 3 (PMNT) thin films were fabricated and investigated. The dielectric properties of the PMNT capacitors were characterized at both dc and radio frequencies. A significant high-κ of 1115 (high capacitance density of 26 fF/μm2) for a PMNT MIM capacitor has been achieved. In addition, small leakage current density of 2×10-10A/cm2 and low loss tangent of 0.0188 are also obtained. The results indicate that high-κ PMNT is a promising candidate material for high-performance MIM capacitors.

Original languageEnglish
Article number5523882
Pages (from-to)996-998
Number of pages3
JournalIEEE Electron Device Letters
Volume31
Issue number9
DOIs
Publication statusPublished - Sep 2010

Keywords

  • Capacitance density
  • dielectric constant
  • high-κ
  • metalinsulatormetal (MIM) capacitor
  • Pb(MgNb) TiO (PMNT)
  • thin-film devices

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