Abstract
High-performance metalinsulatormetal (MIM) capacitors using novel Pb(Mg0.33Nb0.67)0.65Ti0.35O 3 (PMNT) thin films were fabricated and investigated. The dielectric properties of the PMNT capacitors were characterized at both dc and radio frequencies. A significant high-κ of 1115 (high capacitance density of 26 fF/μm2) for a PMNT MIM capacitor has been achieved. In addition, small leakage current density of 2×10-10A/cm2 and low loss tangent of 0.0188 are also obtained. The results indicate that high-κ PMNT is a promising candidate material for high-performance MIM capacitors.
| Original language | English |
|---|---|
| Article number | 5523882 |
| Pages (from-to) | 996-998 |
| Number of pages | 3 |
| Journal | IEEE Electron Device Letters |
| Volume | 31 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Sep 2010 |
Keywords
- Capacitance density
- dielectric constant
- high-κ
- metalinsulatormetal (MIM) capacitor
- Pb(MgNb) TiO (PMNT)
- thin-film devices