High reliable high power diode for welding applications

P. Cova; F. Fasce; P. Pampili; M. Portesine; G. Sozzi; P. E. Zani

doi:10.1016/j.microrel.2004.07.070

High reliable high power diode for welding applications

P. Cova
, F. Fasce
, P. Pampili
, M. Portesine
, G. Sozzi
, P. E. Zani

Research output: Contribution to journal › Article › peer-review

Abstract

Long-term power cycling of high power diodes for welding application is presented. The devices are packaged in an ultra-slim flat package, which allows very high heat sinking capability and rating current. Tests with different operating conditions were carried out and the results compared with the few data available in literature. Our devices show very good lifetime, especially considering that all tests were terminated without any performance degradation. Finally a thermo-electrical model of the device was built and will be used for both validation of lumped element thermal models and evaluation of new design solutions.

Original language	English
Pages (from-to)	1437-1441
Number of pages	5
Journal	Microelectronics Reliability
Volume	44
Issue number	9-11 SPEC. ISS.
DOIs	https://doi.org/10.1016/j.microrel.2004.07.070
Publication status	Published - 1 Sep 2004
Externally published	Yes

Access to Document

10.1016/j.microrel.2004.07.070

Cite this

@article{c497fe515bbd4a93a2737f6984e5bfa0,

title = "High reliable high power diode for welding applications",

abstract = "Long-term power cycling of high power diodes for welding application is presented. The devices are packaged in an ultra-slim flat package, which allows very high heat sinking capability and rating current. Tests with different operating conditions were carried out and the results compared with the few data available in literature. Our devices show very good lifetime, especially considering that all tests were terminated without any performance degradation. Finally a thermo-electrical model of the device was built and will be used for both validation of lumped element thermal models and evaluation of new design solutions.",

author = "P. Cova and F. Fasce and P. Pampili and M. Portesine and G. Sozzi and Zani, \{P. E.\}",

year = "2004",

month = sep,

day = "1",

doi = "10.1016/j.microrel.2004.07.070",

language = "English",

volume = "44",

pages = "1437--1441",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "9-11 SPEC. ISS.",

}

TY - JOUR

T1 - High reliable high power diode for welding applications

AU - Cova, P.

AU - Fasce, F.

AU - Pampili, P.

AU - Portesine, M.

AU - Sozzi, G.

AU - Zani, P. E.

PY - 2004/9/1

Y1 - 2004/9/1

N2 - Long-term power cycling of high power diodes for welding application is presented. The devices are packaged in an ultra-slim flat package, which allows very high heat sinking capability and rating current. Tests with different operating conditions were carried out and the results compared with the few data available in literature. Our devices show very good lifetime, especially considering that all tests were terminated without any performance degradation. Finally a thermo-electrical model of the device was built and will be used for both validation of lumped element thermal models and evaluation of new design solutions.

AB - Long-term power cycling of high power diodes for welding application is presented. The devices are packaged in an ultra-slim flat package, which allows very high heat sinking capability and rating current. Tests with different operating conditions were carried out and the results compared with the few data available in literature. Our devices show very good lifetime, especially considering that all tests were terminated without any performance degradation. Finally a thermo-electrical model of the device was built and will be used for both validation of lumped element thermal models and evaluation of new design solutions.

UR - https://www.scopus.com/pages/publications/4544220412

U2 - 10.1016/j.microrel.2004.07.070

DO - 10.1016/j.microrel.2004.07.070

M3 - Article

AN - SCOPUS:4544220412

SN - 0026-2714

VL - 44

SP - 1437

EP - 1441

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 9-11 SPEC. ISS.

ER -

High reliable high power diode for welding applications

Abstract

Access to Document

Other files and links

Fingerprint

Cite this