Ideal unreactive metal/semiconductor interfaces: The case of Zn/ZnSe(001)

  • S. Rubini
  • , E. Pelucchi
  • , M. Lazzarino
  • , D. Kumar
  • , A. Franciosi
  • , C. Berthod
  • , N. Binggeli
  • , A. Baldereschi

Research output: Contribution to journalArticlepeer-review

Abstract

Zn/ZnSe(001) interfaces fabricated by metal deposition at room temperature onto ZnSe(001) c(2×2), 2 ×1, and 1×1 surfaces were studied by means of x-ray photoemission spectroscopy and current-voltage and capacitance-voltage measurements. All junctions exhibited an ideal unreactive behavior and an identical Schottky barrier height of 1.85 eV (for p-type conduction). Ab initio pseudopotential calculations for model interface configurations provide a microscopic explanation of the different behavior of Zn/ZnSe junctions as compared to Al/ZnSe and Au/ZnSe junctions.

Original languageEnglish
Article number235307
Pages (from-to)2353071-2353078
Number of pages8
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume63
Issue number23
Publication statusPublished - 2001
Externally publishedYes

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