Abstract
Zn/ZnSe(001) interfaces fabricated by metal deposition at room temperature onto ZnSe(001) c(2×2), 2 ×1, and 1×1 surfaces were studied by means of x-ray photoemission spectroscopy and current-voltage and capacitance-voltage measurements. All junctions exhibited an ideal unreactive behavior and an identical Schottky barrier height of 1.85 eV (for p-type conduction). Ab initio pseudopotential calculations for model interface configurations provide a microscopic explanation of the different behavior of Zn/ZnSe junctions as compared to Al/ZnSe and Au/ZnSe junctions.
| Original language | English |
|---|---|
| Article number | 235307 |
| Pages (from-to) | 2353071-2353078 |
| Number of pages | 8 |
| Journal | Physical Review B - Condensed Matter and Materials Physics |
| Volume | 63 |
| Issue number | 23 |
| Publication status | Published - 2001 |
| Externally published | Yes |