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Imaging Assisted Dual Sided Light Coupling Technique for Propagation Loss Estimation of Waveguide Interconnects

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Abstract

A simple, fast, and robust technique for estimating waveguide loss is presented using the scattered light imaging from swapped input-output ports at different wavelengths. The propagation loss is determined by normalizing waveguide output-to-input intensity ratios, making the method insensitive to optical fiber-to-waveguide coupling efficiency. And the spatial variation effects along the waveguide length are mitigated by focusing on relative loss values. The approach is demonstrated on SU8 based multimode waveguides, including both straight and S-bend configurations with 5 mm radius of curvature and bend angles of 15°, 18°, 20° and 25°. The measured losses for these waveguides are (-17,-18,-20,-21,-25 dB/cm at 450 nm,(-19,-22,-24,-27,-33 dB/cm) at 526 nm, and (-9,-11,-14,-14,-24 dB /cm) at 635 nm respectively.

Original languageEnglish
Title of host publication2025 IEEE 75th Electronic Components and Technology Conference (ECTC)
Pages2293-2299
Number of pages7
DOIs
Publication statusPublished - 2025
Event75th IEEE Electronic Components and Technology Conference, ECTC 2025 - Dallas, United States
Duration: 27 May 202530 May 2025

Conference

Conference75th IEEE Electronic Components and Technology Conference, ECTC 2025
Country/TerritoryUnited States
CityDallas
Period27/05/2530/05/25

Keywords

  • dual sided
  • multimode
  • propagation loss
  • RGB imaging
  • SU8
  • waveguide interconnects

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