| Original language | Undefined/Unknown |
|---|---|
| Title of host publication | 2017 47th European Solid-State Device Research Conference (ESSDERC) |
| Publication status | Published - 2017 |
Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver
Impact of impurities, interface traps and contacts on MoS 2 MOSFETs: Modelling and experiments
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review