Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors

Mireia Bargalló Gonzalez; Marcos Maestro-Izquierdo; Francesca Campabadal; Samuel Aldana; Francisco Jiménez-Molinos; Juan Bautista Roldán Aranda

doi:10.1109/irps45951.2020.9128961

Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors

Mireia Bargalló Gonzalez
, Marcos Maestro-Izquierdo
, Francesca Campabadal
, Samuel Aldana
, Francisco Jiménez-Molinos
, Juan Bautista Roldán Aranda

Institut de Microelectrònica de Barcelona, IMB-CNM (CSIC)
University of Granada

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Original language	English
Title of host publication	2020 IEEE International Reliability Physics Symposium (IRPS)
Publisher	IEEE
ISBN (Print)	9781728131993
DOIs	https://doi.org/10.1109/irps45951.2020.9128961
Publication status	Published - Apr 2020
Externally published	Yes

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10.1109/irps45951.2020.9128961

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@inproceedings{53a45a0f69494525859a877fbe14b14a,

title = "Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors",

author = "\{Bargall{\'o} Gonzalez\}, Mireia and Marcos Maestro-Izquierdo and Francesca Campabadal and Samuel Aldana and Francisco Jim{\'e}nez-Molinos and \{Rold{\'a}n Aranda\}, \{Juan Bautista\}",

year = "2020",

month = apr,

doi = "10.1109/irps45951.2020.9128961",

language = "English",

isbn = "9781728131993",

booktitle = "2020 IEEE International Reliability Physics Symposium (IRPS)",

publisher = "IEEE",

}

TY - GEN

T1 - Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors

AU - Bargalló Gonzalez, Mireia

AU - Maestro-Izquierdo, Marcos

AU - Campabadal, Francesca

AU - Aldana, Samuel

AU - Jiménez-Molinos, Francisco

AU - Roldán Aranda, Juan Bautista

PY - 2020/4

Y1 - 2020/4

UR - http://dx.doi.org/10.1109/irps45951.2020.9128961

U2 - 10.1109/irps45951.2020.9128961

DO - 10.1109/irps45951.2020.9128961

M3 - Conference proceeding

SN - 9781728131993

BT - 2020 IEEE International Reliability Physics Symposium (IRPS)

PB - IEEE

ER -

Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors

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