Importance of molding compound chemical shrinkage in the stress and warpage analysis of PQFP's

  • Gerard Kelly
  • , Colin Lyden
  • , William Lawton
  • , John Barrett
  • , Alireza Saboui
  • , Heinz Pape
  • , Henk J.B. Peters

Research output: Contribution to journalArticlepeer-review

Abstract

This paper addresses the use of finite element (FE) techniques to predict residual warpage in plastic quad flat packs (PQFP's) after encapsulation. Experimental measurements of package warpage are used to validate FE models of the packages. Failure to incorporate mold compound chemical shrinkage into the FE analysis leads to erroneous predictions of package warpage. The warpage sensitivity of different packages to changes in downset is presented. The validated FE package models predict stress levels in packages which are 70% greater than those with temperature coefficient of expansion (TCE) shrinkage alone and questions the accuracy of previous simulations which do not include molding compound chemical shrinkage.

Original languageEnglish
Pages (from-to)296-299
Number of pages4
JournalIEEE Transactions on Components Packaging and Manufacturing Technology Part B
Volume19
Issue number2
DOIs
Publication statusPublished - May 1996

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