Inclusion of substrate effects in the flyback method for BJT resistance characterization

Dermot MacSweeney; Kevin McCarthy; Alan Mathewson; J. A. Power; S. C. Kelly

Inclusion of substrate effects in the flyback method for BJT resistance characterization

Dermot MacSweeney
, Kevin McCarthy
, Alan Mathewson
, J. A. Power
, S. C. Kelly

School of Engineering and Architecture

University College Cork

Research output: Contribution to conference › Paper › peer-review

Abstract

The effect of substrate interaction on the R_E flyback method is analyzed and a new method is proposed to account for this during the extraction of R_E. The extracted R_E values compared well with those obtained by the Ning-Tang method and scale well with area. The sub-circuit model proposed provides a deeper understanding of the operation of the real device under the R_E flyback conditions, and thus, gives increased confidence in the results obtained.

Original language	English
Pages	194-199
Number of pages	6
Publication status	Published - 1999
Event	Proceedings of the 1999 International Conference on Microelectronic Test Structures, ICMTS 1999 - Goteborg, Swed Duration: 15 Mar 1999 → 18 Mar 1999

Conference

Conference	Proceedings of the 1999 International Conference on Microelectronic Test Structures, ICMTS 1999
City	Goteborg, Swed
Period	15/03/99 → 18/03/99

Cite this

@conference{afb74741609d458490acbe4ce14d9221,

title = "Inclusion of substrate effects in the flyback method for BJT resistance characterization",

abstract = "The effect of substrate interaction on the RE flyback method is analyzed and a new method is proposed to account for this during the extraction of RE. The extracted RE values compared well with those obtained by the Ning-Tang method and scale well with area. The sub-circuit model proposed provides a deeper understanding of the operation of the real device under the RE flyback conditions, and thus, gives increased confidence in the results obtained.",

author = "Dermot MacSweeney and Kevin McCarthy and Alan Mathewson and Power, \{J. A.\} and Kelly, \{S. C.\}",

year = "1999",

language = "English",

pages = "194--199",

note = "Proceedings of the 1999 International Conference on Microelectronic Test Structures, ICMTS 1999 ; Conference date: 15-03-1999 Through 18-03-1999",

}

TY - CONF

T1 - Inclusion of substrate effects in the flyback method for BJT resistance characterization

AU - MacSweeney, Dermot

AU - McCarthy, Kevin

AU - Mathewson, Alan

AU - Power, J. A.

AU - Kelly, S. C.

PY - 1999

Y1 - 1999

N2 - The effect of substrate interaction on the RE flyback method is analyzed and a new method is proposed to account for this during the extraction of RE. The extracted RE values compared well with those obtained by the Ning-Tang method and scale well with area. The sub-circuit model proposed provides a deeper understanding of the operation of the real device under the RE flyback conditions, and thus, gives increased confidence in the results obtained.

AB - The effect of substrate interaction on the RE flyback method is analyzed and a new method is proposed to account for this during the extraction of RE. The extracted RE values compared well with those obtained by the Ning-Tang method and scale well with area. The sub-circuit model proposed provides a deeper understanding of the operation of the real device under the RE flyback conditions, and thus, gives increased confidence in the results obtained.

UR - https://www.scopus.com/pages/publications/0032680862

M3 - Paper

AN - SCOPUS:0032680862

SP - 194

EP - 199

T2 - Proceedings of the 1999 International Conference on Microelectronic Test Structures, ICMTS 1999

Y2 - 15 March 1999 through 18 March 1999

ER -

Inclusion of substrate effects in the flyback method for BJT resistance characterization

Abstract

Conference

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