Abstract
In this paper, the inductances of high-leakage transformers are Investigated by analysis, measurement, and finite-element simulation. Series-coupling tests, featuring differential coupling (series opposing) and cumulative coupling (series aiding), are conducted in addition to the standard open-circuit and short-circuit tests. This paper initially reviews and discusses the various test approaches featuring the open-circuit, short-circuit and series-coupling tests. Two very different types of high-leakage transformers are then characterized based on these tests. The short-circuit and series-coupling tests performed comparably for Investigating the spatial variations of the primary and secondary leakage Inductances of the high-power, highleakage transformer first investigated. For the second low-power, high-leakage, high-resistance planar transformer the differential-coupling test proves to be a more useful, accurate, and insightful test than the short-circuit test.
| Original language | English |
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| Pages | 1150-1156 |
| Number of pages | 7 |
| Publication status | Published - 2003 |
| Event | Eigtheenth Annual IEEE Applied Power Electronics Conference and Exposition - Miami Beach, FL, United States Duration: 9 Feb 2003 → 13 Feb 2003 |
Conference
| Conference | Eigtheenth Annual IEEE Applied Power Electronics Conference and Exposition |
|---|---|
| Country/Territory | United States |
| City | Miami Beach, FL |
| Period | 9/02/03 → 13/02/03 |