Inductance characterization of high-leakage transformers

  • John G. Hayes
  • , Neil O'Donovan
  • , Michael G. Egan
  • , Terence O'Donnell

Research output: Contribution to conferencePaperpeer-review

Abstract

In this paper, the inductances of high-leakage transformers are Investigated by analysis, measurement, and finite-element simulation. Series-coupling tests, featuring differential coupling (series opposing) and cumulative coupling (series aiding), are conducted in addition to the standard open-circuit and short-circuit tests. This paper initially reviews and discusses the various test approaches featuring the open-circuit, short-circuit and series-coupling tests. Two very different types of high-leakage transformers are then characterized based on these tests. The short-circuit and series-coupling tests performed comparably for Investigating the spatial variations of the primary and secondary leakage Inductances of the high-power, highleakage transformer first investigated. For the second low-power, high-leakage, high-resistance planar transformer the differential-coupling test proves to be a more useful, accurate, and insightful test than the short-circuit test.

Original languageEnglish
Pages1150-1156
Number of pages7
Publication statusPublished - 2003
EventEigtheenth Annual IEEE Applied Power Electronics Conference and Exposition - Miami Beach, FL, United States
Duration: 9 Feb 200313 Feb 2003

Conference

ConferenceEigtheenth Annual IEEE Applied Power Electronics Conference and Exposition
Country/TerritoryUnited States
CityMiami Beach, FL
Period9/02/0313/02/03

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