Influence of deep levels on CdZnTe nuclear detectors

  • A. Zerrai
  • , K. Cherkaoui
  • , G. Marrakchi
  • , G. Brémond
  • , P. Fougères
  • , M. Hage-Ali
  • , J. M. Koebel
  • , P. Siffert

Research output: Contribution to journalArticlepeer-review

Abstract

We report deep level characterization on CdZnTe nuclear detectors grown by the high pressure Bridgman method. Three CdZnTe samples taken from the top, middle and tail of the same ingot were investigated using photo-induced current transient spectroscopy and thermoelectric-effect spectroscopy. Three major traps are detected and their influence on the nuclear detection properties are discussed.

Original languageEnglish
Pages (from-to)646-649
Number of pages4
JournalJournal of Crystal Growth
Volume197
Issue number3
DOIs
Publication statusPublished - 15 Feb 1999
Externally publishedYes

Keywords

  • Cadmium zinc telluride
  • Deep level
  • Nuclear detector
  • PICTS
  • TEES

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