Abstract
We report deep level characterization on CdZnTe nuclear detectors grown by the high pressure Bridgman method. Three CdZnTe samples taken from the top, middle and tail of the same ingot were investigated using photo-induced current transient spectroscopy and thermoelectric-effect spectroscopy. Three major traps are detected and their influence on the nuclear detection properties are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 646-649 |
| Number of pages | 4 |
| Journal | Journal of Crystal Growth |
| Volume | 197 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 15 Feb 1999 |
| Externally published | Yes |
Keywords
- Cadmium zinc telluride
- Deep level
- Nuclear detector
- PICTS
- TEES
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