Abstract
A simple yet versatile lithographic method was proposed to achieve arbitrary transverse and longitudinal density profiles of semiconductor lasers. To ensure that the current density is not modulated significantly in the longitudinal direction, a laser was cleaved perpendicular to the digits and the spontaneous emission was scanned through the side of the laser both below and above the lasing threshold. The near-fields from the two lasers were compared with a normal broad area laser for a range of pump currents under quasi-continuous wave operation. The conventional broad area laser showed typical multi-mode transverse dynamics, whereas both lasers with tailored current profiles showed much more stable near-fields.
| Original language | English |
|---|---|
| Pages (from-to) | 282-283 |
| Number of pages | 2 |
| Journal | Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS |
| Volume | 1 |
| Publication status | Published - 1998 |
| Event | Proceedings of the 1998 11th Annual Meeting IEEE Lasers and Electro-Optics Society, LEOS. Part 2 (of 2) - Orlando, FL, USA Duration: 1 Dec 1998 → 4 Dec 1998 |