Inhomogeneous pumping of semiconductor lasers by contact profiling

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Abstract

A simple yet versatile lithographic method was proposed to achieve arbitrary transverse and longitudinal density profiles of semiconductor lasers. To ensure that the current density is not modulated significantly in the longitudinal direction, a laser was cleaved perpendicular to the digits and the spontaneous emission was scanned through the side of the laser both below and above the lasing threshold. The near-fields from the two lasers were compared with a normal broad area laser for a range of pump currents under quasi-continuous wave operation. The conventional broad area laser showed typical multi-mode transverse dynamics, whereas both lasers with tailored current profiles showed much more stable near-fields.

Original languageEnglish
Pages (from-to)282-283
Number of pages2
JournalConference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS
Volume1
Publication statusPublished - 1998
EventProceedings of the 1998 11th Annual Meeting IEEE Lasers and Electro-Optics Society, LEOS. Part 2 (of 2) - Orlando, FL, USA
Duration: 1 Dec 19984 Dec 1998

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