Abstract
Thin films of tungsten-doped vanadium(IV) oxide were prepared on glass substrates from the atmospheric pressure chemical vapor deposition of vanadium(IV) chloride, tungsten-(VI) ethoxide, and water at 500-600 °C. The films were characterized by Raman microscopy, glancing angle X-ray diffraction (GAXRD), X-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS), scanning electron microscopy (SEM), and vis/IR reflectance-transmittance. The films showed a reduction in thermochromic transition temperatures from 68 °C in VO2 to 42 °C in V0.99W0.01O 2-approaching that required for commercial use as an intelligent window coating.
| Original language | English |
|---|---|
| Pages (from-to) | 744-749 |
| Number of pages | 6 |
| Journal | Chemistry of Materials |
| Volume | 16 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 24 Feb 2004 |
| Externally published | Yes |
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