Abstract
Thin films of the vanadium oxides, V2O5, VO2, VOx (x = 2.00-2.50) and V6O13 were prepared on glass substrates by atmospheric pressure chemical vapour deposition (APCVD) of vanadium tetrachloride and water at 400-550°C. The specific phase deposited was found to be dependent on the substrate temperature and the reagent concentrations. The films were characterised by Raman microscopy, x-ray diffraction (XRD), Rutherford backscattering (RBS), scanning electron microscopy (SEM), energy dispersive analysis by x-rays (EDX), reflectance/transmittance and UV absorption spectroscopy. The VO2 films show by Raman microscopy and reflectance/transmittance spectroscopy, reversible switching behaviour at 68°C associated with a phase change from monoclinic (MoO2 structure) to tetragonal (TiO2, rutile structure).
| Original language | English |
|---|---|
| Pages (from-to) | 2936-2939 |
| Number of pages | 4 |
| Journal | Journal of Materials Chemistry |
| Volume | 12 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1 Oct 2002 |
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