Inverse Gaussian distribution based timing analysis of Sub-threshold CMOS circuits

  • Jiaoyan Chen
  • , Sorin Cotofana
  • , Satish Grandhi
  • , Christian Spagnol
  • , Emanuel Popovici

Research output: Contribution to journalArticlepeer-review

Abstract

Aggressive technology scaling and ultra low power constraints have resulted in less predictable device behavior complicating timing analysis/estimation. The traditional delay models fail to accurately capture the circuit behavior under such conditions. This paper proposes a novel highly accurate Inverse Gaussian Distribution (IGD) based delay model applicable to both combinational and sequential elements for sub-powered circuits. The IGD based delay estimation accuracy is demonstrated by evaluating multiple circuits, i.e., D Flip Flops (DFFs) + 8-bit Ripple Carry Adder, and 8-bit De-multiplexer (DEMUX) and Multiplexer (MUX). Our experiments indicate that the IGD based approach provides a high matching against HSPICE Monte Carlo simulation results, with an average error less than 1.9% and 1.2% for the two circuits, respectively, while sparing orders of magnitude simulation time. Moreover, the IGD model outperforms the traditional Gaussian Distribution (GD) model by providing 6 × better average accuracy with no extra simulation time overhead.

Original languageEnglish
Pages (from-to)2754-2761
Number of pages8
JournalMicroelectronics Reliability
Volume55
Issue number12
DOIs
Publication statusPublished - 1 Dec 2015

Keywords

  • CMOS process variations
  • Delay model
  • Near/sub-threshold operation
  • Statistical modeling
  • Timing analysis

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