Investigating interface states and oxide traps in the MoS2/oxide/Si system

E Coleman; Gioele Mirabelli; P Bolshakov; P Zhao; Enrico Caruso; Farzan Gity; Scott Monaghan; Karim Cherkaoui; V Balestra; RM Wallace; others

Investigating interface states and oxide traps in the MoS2/oxide/Si system

E Coleman
, Gioele Mirabelli
, P Bolshakov
, P Zhao
, Enrico Caruso
, Farzan Gity
, Scott Monaghan
, Karim Cherkaoui
, V Balestra
, RM Wallace
, others

Tyndall MicroNano Systems

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Journal	Solid-State Electronics
Publication status	Published - 2021

Cite this

@article{c0ad426a2223493390dd4130ff0a66cd,

title = "Investigating interface states and oxide traps in the MoS2/oxide/Si system",

author = "E Coleman and Gioele Mirabelli and P Bolshakov and P Zhao and Enrico Caruso and Farzan Gity and Scott Monaghan and Karim Cherkaoui and V Balestra and RM Wallace and others",

year = "2021",

language = "Undefined/Unknown",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier Ltd",

}

TY - JOUR

T1 - Investigating interface states and oxide traps in the MoS2/oxide/Si system

AU - Coleman, E

AU - Mirabelli, Gioele

AU - Bolshakov, P

AU - Zhao, P

AU - Caruso, Enrico

AU - Gity, Farzan

AU - Monaghan, Scott

AU - Cherkaoui, Karim

AU - Balestra, V

AU - Wallace, RM

AU - others,

PY - 2021

Y1 - 2021

M3 - Article

SN - 0038-1101

JO - Solid-State Electronics

JF - Solid-State Electronics

ER -