Skip to main navigation Skip to search Skip to main content

Investigation into SiGe HBT class E/F PA efficiency at 2 GHz for VDD from 1 to 1.8 V

  • John A. O'Sullivan
  • , Kevin G. McCarthy
  • , Aidan C. Murphy
  • , Patrick J. Murphy
  • IEEE
  • Freescale Semiconductor

Research output: Contribution to journal › Review article › peer-review

Fingerprint

Dive into the research topics of 'Investigation into SiGe HBT class E/F PA efficiency at 2 GHz for VDD from 1 to 1.8 V'. Together they form a unique fingerprint.
Sort by

Engineering