Kinetic Monte Carlo analysis of data retention in Al:HfO2-based resistive random access memories
- Samuel Aldana
- , Eduardo Perez
- , Francisco Jiménez-Molinos
- , Christian Wenger
- , Juan Bautista Roldán Aranda
- University of Granada
- IHP–Leibniz Institut für innovative Mikroelektronik
- Brandenburg University of Technology
Research output: Contribution to journal › Article › peer-review