Leakage current effects on C-V plots of high- k metal-oxide-semiconductor capacitors
- Y. Lu
- , S. Hall
- , L. Z. Tan
- , I. Z. Mitrovic
- , W. M. Davey
- , B. Raeissi
- , O. Engström
- , K. Cherkaoui
- , S. Monaghan
- , P. K. Hurley
- , H. D.B. Gottlob
- , M. C. Lemme
Research output: Contribution to journal › Article › peer-review