Leakage current effects on CV plots of high-k MOS capacitors

Y Lu; S Hall; IZ Mitrovic; WM Davey; Bahman Raeissi; Olof Engström; K Cherkaoui; S Monaghan; PK Hurley; HDB Gottlob; others

Leakage current effects on CV plots of high-k MOS capacitors

Y Lu
, S Hall
, IZ Mitrovic
, WM Davey
, Bahman Raeissi
, Olof Engström
, K Cherkaoui
, S Monaghan
, PK Hurley
, HDB Gottlob
, others

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Original language	Undefined/Unknown
Title of host publication	WODIM, Berlin, June 2008
Publication status	Published - 2008

Cite this

@inproceedings{dcfcee3949f84f20bdf7301436941e06,

title = "Leakage current effects on CV plots of high-k MOS capacitors",

author = "Y Lu and S Hall and IZ Mitrovic and WM Davey and Bahman Raeissi and Olof Engstr{\"o}m and K Cherkaoui and S Monaghan and PK Hurley and HDB Gottlob and others",

year = "2008",

language = "Undefined/Unknown",

booktitle = "WODIM, Berlin, June 2008",

}