Low fatigue lead zirconate titanate-based capacitors modified by manganese for nonvolatile memories

  • Q. Zhang
  • , R. W. Whatmore

Research output: Other outputpeer-review

Abstract

We have investigated the effects of Mn doping on the ferroelectric properties of Pb(Zr0.3Ti0.7)O3 (PZT) thin films on substrates Pt/Ti/SiO2/Si. Small amount of Mn-doped (≤1mol%) PZT (PMZT) showed almost no hysteretic fatigue up to 1010 switching bipolar pulse cycles, coupled with excellent retention properties. We present evidence that while a low permittivity interfacial layer forms between the Pt electrode and PZT films, this does not occur in PMZT. We propose that Mn dopants are able to reduce oxygen vacancy mobility in PZT films and Mn2+ ions consume the oxygen vacancies generated during repeated switching, forming Mn4+ ions. These mechanisms are probably responsible for their low observed fatigue characteristics.

Original languageEnglish
Number of pages5
Edition1-3
Volume109
DOIs
Publication statusPublished - 15 Jun 2004

Publication series

NameMaterials Science and Engineering: B
PublisherElsevier Ltd
ISSN (Print)0921-5107

Keywords

  • Ferroelectric properties
  • PZT
  • Sol-gel
  • Thin films

Fingerprint

Dive into the research topics of 'Low fatigue lead zirconate titanate-based capacitors modified by manganese for nonvolatile memories'. Together they form a unique fingerprint.

Cite this