Low-temperature molecular beam epitaxy growth of Si/SiGe THz quantum cascade structures on virtual substrates

  • M. Zhao
  • , W. X. Ni
  • , P. Townsend
  • , S. A. Lynch
  • , D. J. Paul
  • , C. C. Hsu
  • , M. N. Chang

Research output: Contribution to journalArticlepeer-review

Abstract

Si/SiGe quantum cascade structures containing superlattice up to 100 periods have been grown on SiGe virtual substrates by using solid-source molecular beam epitaxy at low temperature. The surface morphology and structural properties of the grown samples were characterized using various experimental techniques. It has been concluded that the structures were completely symmetrically strained with high crystalline quality, precise layer parameters, and excellent reproducibility. Electroluminescence was observed with peaked intensity at ∼3 THz at both 4 and 40 K, which agrees very well with expected interwell intersubband transition according to the design.

Original languageEnglish
Pages (from-to)24-28
Number of pages5
JournalThin Solid Films
Volume508
Issue number1-2
DOIs
Publication statusPublished - 5 Jun 2006
Externally publishedYes

Keywords

  • Molecular beam epitaxy (MBE)
  • Quantum cascade
  • Si/SiGe
  • X-ray diffraction

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