Materials and Defect Aspects of III-V and III-N Devices for High-Speed Analog/RF Applications
- Eddy Simoen
- , Po Chun Brent Hsu
- , Hao Yu
- , Hongyue Wang
- , Ming Zhao
- , Kenichiro Takakura
- , Vamsi Putcha
- , Uthayasankaran Peralagu
- , Bertrand Parvais
- , Niamh Waldron
- , Nadine Collaert
- Interuniversitair Micro-Elektronica Centrum
- KU Leuven
- Peking University
- National Institute of Technology, Kumamoto College
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review