Measurement of linewidth enhancement factors for InGaAlAs laser diode by Fourier series expansion method

D. Byrne; W. H. Guo; R. Phelan; Q. Y. Lu; J. F. Donegan; B. Corbett

doi:10.1049/el:20072016

Measurement of linewidth enhancement factors for InGaAlAs laser diode by Fourier series expansion method

D. Byrne
, W. H. Guo
, R. Phelan
, Q. Y. Lu
, J. F. Donegan
, B. Corbett

Taighde Éireann - Research Ireland

Research output: Contribution to journal › Article › peer-review

Abstract

The Fourier series expansion method is used to measure the linewidth enhancement factor of an InGaAlAs Fabry-Pérot semiconductor laser from the below-threshold amplified spontaneous emission spectrum. It is shown that using this method, the linewidth enhancement factor can be obtained independently of the resolution bandwidth of the optical spectrum analyser.

Original language	English
Pages (from-to)	1145-1146
Number of pages	2
Journal	Electronics Letters
Volume	43
Issue number	21
DOIs	https://doi.org/10.1049/el:20072016
Publication status	Published - 2007

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10.1049/el:20072016

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title = "Measurement of linewidth enhancement factors for InGaAlAs laser diode by Fourier series expansion method",

abstract = "The Fourier series expansion method is used to measure the linewidth enhancement factor of an InGaAlAs Fabry-P{\'e}rot semiconductor laser from the below-threshold amplified spontaneous emission spectrum. It is shown that using this method, the linewidth enhancement factor can be obtained independently of the resolution bandwidth of the optical spectrum analyser.",

author = "D. Byrne and Guo, \{W. H.\} and R. Phelan and Lu, \{Q. Y.\} and Donegan, \{J. F.\} and B. Corbett",

year = "2007",

doi = "10.1049/el:20072016",

language = "English",

volume = "43",

pages = "1145--1146",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "John Wiley \& Sons Inc.",

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T1 - Measurement of linewidth enhancement factors for InGaAlAs laser diode by Fourier series expansion method

AU - Byrne, D.

AU - Guo, W. H.

AU - Phelan, R.

AU - Lu, Q. Y.

AU - Donegan, J. F.

AU - Corbett, B.

PY - 2007

Y1 - 2007

N2 - The Fourier series expansion method is used to measure the linewidth enhancement factor of an InGaAlAs Fabry-Pérot semiconductor laser from the below-threshold amplified spontaneous emission spectrum. It is shown that using this method, the linewidth enhancement factor can be obtained independently of the resolution bandwidth of the optical spectrum analyser.

AB - The Fourier series expansion method is used to measure the linewidth enhancement factor of an InGaAlAs Fabry-Pérot semiconductor laser from the below-threshold amplified spontaneous emission spectrum. It is shown that using this method, the linewidth enhancement factor can be obtained independently of the resolution bandwidth of the optical spectrum analyser.

UR - https://www.scopus.com/pages/publications/35148877233

U2 - 10.1049/el:20072016

DO - 10.1049/el:20072016

M3 - Article

AN - SCOPUS:35148877233

SN - 0013-5194

VL - 43

SP - 1145

EP - 1146

JO - Electronics Letters

JF - Electronics Letters

IS - 21

ER -

Measurement of linewidth enhancement factors for InGaAlAs laser diode by Fourier series expansion method

Abstract

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