Metallic and semiconducting nanowires studied by TEM-SPM

D. Erts; B. Polyakov; A. Lohmus; R. Lohmus; H. Olin; M. A. Morris; J. D. Holmes

Metallic and semiconducting nanowires studied by TEM-SPM

D. Erts
, B. Polyakov
, A. Lohmus
, R. Lohmus
, H. Olin
, M. A. Morris
, J. D. Holmes

School of Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires.

Original language	English
Pages (from-to)	65-74
Number of pages	10
Journal	Physics of Low-Dimensional Structures
Volume	3-4
Publication status	Published - 2003

Cite this

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title = "Metallic and semiconducting nanowires studied by TEM-SPM",

abstract = "Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires.",

author = "D. Erts and B. Polyakov and A. Lohmus and R. Lohmus and H. Olin and Morris, \{M. A.\} and Holmes, \{J. D.\}",

year = "2003",

language = "English",

volume = "3-4",

pages = "65--74",

journal = "Physics of Low-Dimensional Structures",

issn = "0204-3467",

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TY - JOUR

T1 - Metallic and semiconducting nanowires studied by TEM-SPM

AU - Erts, D.

AU - Polyakov, B.

AU - Lohmus, A.

AU - Lohmus, R.

AU - Olin, H.

AU - Morris, M. A.

AU - Holmes, J. D.

PY - 2003

Y1 - 2003

N2 - Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires.

AB - Nanowires are expected to play an important role in future electronic, optical devices and nanoelectromechanical devices. Measuring the electrical and mechanical properties of nanowires is however a difficult task due to their small dimensions. Here we report the use of an in situ microscopy technique, which combines transmission electron microscopy (TEM) with scanning probe microscopy (SPM), to investigate the electrical and mechanical properties of metallic and semiconductor nanowires.

UR - https://www.scopus.com/pages/publications/0041530113

M3 - Article

AN - SCOPUS:0041530113

SN - 0204-3467

VL - 3-4

SP - 65

EP - 74

JO - Physics of Low-Dimensional Structures

JF - Physics of Low-Dimensional Structures

ER -

Metallic and semiconducting nanowires studied by TEM-SPM

Abstract

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