Microelectronics Reliability: Editorial

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	767-769
Number of pages	3
Journal	Microelectronics Reliability
Volume	45
Issue number	5-6
DOIs	https://doi.org/10.1016/j.microrel.2004.11.006
Publication status	Published - May 2005

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@article{6ec6513a73934071a819fff53d0b3cbe,

title = "Microelectronics Reliability: Editorial",

author = "Paul Hurley",

year = "2005",

month = may,

doi = "10.1016/j.microrel.2004.11.006",

language = "English",

volume = "45",

pages = "767--769",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Ltd",

number = "5-6",

}

TY - JOUR

T1 - Microelectronics Reliability

T2 - Editorial

AU - Hurley, Paul

PY - 2005/5

Y1 - 2005/5

UR - https://www.scopus.com/pages/publications/14644415562

U2 - 10.1016/j.microrel.2004.11.006

DO - 10.1016/j.microrel.2004.11.006

M3 - Article

AN - SCOPUS:14644415562

SN - 0026-2714

VL - 45

SP - 767

EP - 769

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 5-6

ER -