Abstract
Lead zirconate titanate (PZT) thin films were prepared by sol-gel techniques at various conditions and characterised by X-ray diffraction and transmission electron microscopy. It was found that perovskite PZT was starting to nucleate and grow at a temperature as low as 420 °C. Good quality thin films of columnar perovskite PZT was produced at the temperature of 460 °C. Drying and firing temperatures were found to be major factors to determine the preferential orientation of the thin films.
| Original language | English |
|---|---|
| Pages (from-to) | S1461-S1463 |
| Journal | Journal of the Korean Physical Society |
| Volume | 32 |
| Issue number | 4 SUPPL. |
| Publication status | Published - 1998 |
| Externally published | Yes |