Abstract
Thin films of zirconia and zirconates have a variety of important applications. MOCVD is an attractive technique for the preparation of these films, but there are a number of drawbacks associated with the currently used Zr precursors. This paper reports on a new class of precursor of the form [Zr(OR)2(thd)2], where R = iPr or tBu, which allows growth by liquid injection of ZrO2 under transport-controlled conditions at significantly lower temperatures than can be achieved with conventional sources.
| Original language | English |
|---|---|
| Pages (from-to) | 46-49 |
| Number of pages | 4 |
| Journal | Chemical Vapor Deposition |
| Volume | 4 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 1998 |
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