Abstract
In the present study we rely in different experimental measurements to show that the mode structure changes with the current are reflected onto the output power vs. current characteristics of the device. We address the evolution of the modal structure of a twin ridge as we change the level of current injection among the two ridges. We show that the complex behavior during ridge coupling and the appearance of the lateral modes of the arrays are qualitatively represented in these curves. This information is important in two related aspects: a) Determine when the two ridges start to interact, giving rise to a high frequency locking phenomena and b) Study appropriate models of the device that account for the observed phenomena.
| Original language | English |
|---|---|
| Pages (from-to) | 57-64 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4986 |
| DOIs | |
| Publication status | Published - 2003 |
| Externally published | Yes |
| Event | PROCEEDINGS OF SPIE SPIE - The International Society for Optical Engineering: Physics and Simulation of Optoelectronic Devices XI - San Jose, CA, United States Duration: 27 Jan 2003 → 31 Jan 2003 |
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