Abstract
Detection and identification of failures is a critical task in the automatic control of large and complex systems. In the realm of discrete event systems, Sampath el al. proposed a new approach to failure diagnosis that models the logical behavior of the considered system in terms of state machines and produces an extended observer called a diagnoser for computing diagnoses. We extend this approach to the diagnosis of timed discrete event systems whose temporal and logical behavior are modeled by a framework proposed by Brandin and Wonham. We use a simple real-world factory conveyor example to demonstrate our modeling and diagnosis approach.
| Original language | English |
|---|---|
| Pages (from-to) | 31-36 |
| Number of pages | 6 |
| Journal | Proceedings of the American Control Conference |
| Volume | 1 |
| Publication status | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 American Control Conference. Part 3 (of 6) - Albuquerque, NM, USA Duration: 4 Jun 1997 → 6 Jun 1997 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
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