Modeling and diagnosis of timed discrete event systems - a factory automation example

Research output: Contribution to journalArticlepeer-review

Abstract

Detection and identification of failures is a critical task in the automatic control of large and complex systems. In the realm of discrete event systems, Sampath el al. proposed a new approach to failure diagnosis that models the logical behavior of the considered system in terms of state machines and produces an extended observer called a diagnoser for computing diagnoses. We extend this approach to the diagnosis of timed discrete event systems whose temporal and logical behavior are modeled by a framework proposed by Brandin and Wonham. We use a simple real-world factory conveyor example to demonstrate our modeling and diagnosis approach.

Original languageEnglish
Pages (from-to)31-36
Number of pages6
JournalProceedings of the American Control Conference
Volume1
Publication statusPublished - 1997
Externally publishedYes
EventProceedings of the 1997 American Control Conference. Part 3 (of 6) - Albuquerque, NM, USA
Duration: 4 Jun 19976 Jun 1997

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 9 - Industry, Innovation, and Infrastructure
    SDG 9 Industry, Innovation, and Infrastructure

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