Skip to main navigation Skip to search Skip to main content

Modeling the effects of interface traps on passive quenching of a Ge/Si Geiger mode avalanche photodiode

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Abstract

The influence of interface donor and acceptor traps on the behavior of Ge/Si separate absorption, charge and multiplication (SACM) Geiger mode avalanche photodiodes (GM-APDs) under passive quenching is modeled. The effects of different trap types on the quenching behavior are investigated in this paper for the first time. Our results show that trap type and trap density significantly influence the APD quenching time and ability to quench for a particular quenching resistor.

Original languageEnglish
Title of host publication11th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2011
Pages205-206
Number of pages2
DOIs
Publication statusPublished - 2011
Event11th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2011 - Rome, Italy
Duration: 5 Sep 20118 Sep 2011

Publication series

NameProceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD
ISSN (Print)2158-3234

Conference

Conference11th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2011
Country/TerritoryItaly
CityRome
Period5/09/118/09/11

Keywords

  • Avalanche photodiode (APD)
  • Geiger mode (GM)
  • germanium
  • interface trap
  • passive quenching
  • silicon

Fingerprint

Dive into the research topics of 'Modeling the effects of interface traps on passive quenching of a Ge/Si Geiger mode avalanche photodiode'. Together they form a unique fingerprint.

Cite this