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Monitoring PMMA elimination by reactive ion etching from a lamellar PS-b-PMMA thin film by ex situ TEM methods

  • Richard A. Farrell
  • , Nikolay Petkov
  • , Matthew T. Shaw
  • , Vladimir Djara
  • , Justin D. Holmes
  • , Michael A. Morris

Research output: Contribution to journal › Article › peer-review

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