TY - JOUR
T1 - Multi-component diffusion theory of quantum well intermixing
AU - Murphy, Tommy
AU - Broderick, Christopher A.
AU - Peters, Frank H.
AU - O’Reilly, Eoin P.
N1 - Publisher Copyright:
© 2025 The Author(s). Published by IOP Publishing Ltd.
PY - 2025/10
Y1 - 2025/10
N2 - Quantum well (QW) intermixing via post-growth annealing enables integration of active and passive components in photonic integrated circuits. QW intermixing generally produces a blueshift of the QW band gap, rendering the intermixed section of a QW transparent to a laser fabricated from a non-intermixed section of the same structure. Experimental studies on Al1−x−yInyGaxAs/InP QWs have, however, identified structures in which intermixing produces a redshift of the band gap. This redshift is anomalous insofar as it is not explained by previous models of QW intermixing based on Fick’s law. To overcome this limitation we apply a generalized (multi-component) form of Fick’s law to describe inter-diffusion of Ga, In and Al in Al1−x−yInyGaxAs/InP. Based on the experimental observation that annealing can drive strong Ga and In intermixing but Al diffuses minimally, we demonstrate that intermixing in Al1−x−yInyGaxAs QWs can be formulated as a coupled inter-diffusion problem characterized by independent Ga- and In-related diffusivities, which increase with increasing strain in the QW, and suppressed Al diffusion. The intermixing is governed by the ratio of these diffusivities, which can drive a counterintuitive process that explains the experimentally observed redshift: namely, diffusion of additional In into the well upon annealing of a structure having equal well and barrier In compositions. The model is validated via comparison to experiment. First, by showing that it can quantitatively describe measured composition profiles. Second, via empirical parameterization of the diffusion coefficients, which we demonstrate as sufficient to quantitatively reproduce the measured QW band gap shift vs. annealing temperature.
AB - Quantum well (QW) intermixing via post-growth annealing enables integration of active and passive components in photonic integrated circuits. QW intermixing generally produces a blueshift of the QW band gap, rendering the intermixed section of a QW transparent to a laser fabricated from a non-intermixed section of the same structure. Experimental studies on Al1−x−yInyGaxAs/InP QWs have, however, identified structures in which intermixing produces a redshift of the band gap. This redshift is anomalous insofar as it is not explained by previous models of QW intermixing based on Fick’s law. To overcome this limitation we apply a generalized (multi-component) form of Fick’s law to describe inter-diffusion of Ga, In and Al in Al1−x−yInyGaxAs/InP. Based on the experimental observation that annealing can drive strong Ga and In intermixing but Al diffuses minimally, we demonstrate that intermixing in Al1−x−yInyGaxAs QWs can be formulated as a coupled inter-diffusion problem characterized by independent Ga- and In-related diffusivities, which increase with increasing strain in the QW, and suppressed Al diffusion. The intermixing is governed by the ratio of these diffusivities, which can drive a counterintuitive process that explains the experimentally observed redshift: namely, diffusion of additional In into the well upon annealing of a structure having equal well and barrier In compositions. The model is validated via comparison to experiment. First, by showing that it can quantitatively describe measured composition profiles. Second, via empirical parameterization of the diffusion coefficients, which we demonstrate as sufficient to quantitatively reproduce the measured QW band gap shift vs. annealing temperature.
KW - electro-absorption modulators
KW - III-V materials
KW - photonic integrated circuits
KW - quantum well intermixing
UR - https://www.scopus.com/pages/publications/105015833588
U2 - 10.1088/2515-7647/adfda3
DO - 10.1088/2515-7647/adfda3
M3 - Article
AN - SCOPUS:105015833588
SN - 2515-7647
VL - 7
JO - JPhys Photonics
JF - JPhys Photonics
IS - 4
M1 - 045008
ER -