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Nanoscale charge transfer and diffusion at the MoS2/SiO2 interface by atomic force microscopy: Contact injection versus triboelectrification

  • Rui Xu
  • , Shili Ye
  • , Kunqi Xu
  • , Le Lei
  • , Sabir Hussain
  • , Zhiyue Zheng
  • , Fei Pang
  • , Shuya Xing
  • , Xinmeng Liu
  • , Wei Ji
  • , Zhihai Cheng
  • National Center for Nanoscience and Technology
  • Renmin University of China
  • University of Chinese Academy of Sciences

Research output: Contribution to journal › Article › peer-review

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