Near ideal, high barrier, Au-nGaN Schottky contacts

  • T. G.G. Maffeis
  • , M. C. Simmonds
  • , S. A. Clark
  • , F. Peiro
  • , P. Haines
  • , P. J. Parbrook

Research output: Contribution to journalArticlepeer-review

Abstract

Gold Schottky contacts formed in situ on n-type GaN after a 600 °C anneal have been characterized by current-voltage (I-V) measurements and x-ray photoelectron spectroscopy (XPS). The mean Schottky barrier height and lowest ideality factor were found to be 1.24 eV and 1.03, respectively, as measured by I-V. The highest barrier measured was 1.35 eV with an ideality factor of 1.12. XPS data showed that the 600 °C anneal produced an upward band bending of 0.35 eV, the subsequent gold deposition caused a further band bending of 0.25 eV in the same direction. Our results can be interpreted in terms of the Cowley-Sze model and suggest a high density of acceptor states at the bare GaN surface.

Original languageEnglish
Pages (from-to)L115-L118
JournalJournal of Physics D: Applied Physics
Volume33
Issue number20
DOIs
Publication statusPublished - 21 Oct 2000
Externally publishedYes

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