Non-contact no-moving parts surface height measurement sensor using liquid crystal-based axial scanning confocal optical microscopy

Research output: Chapter in Book/Report/Conference proceedingsConference proceedingpeer-review

Abstract

An analog liquid crystal lens-based axial scanning confocal microscope is demonstrated as a 48 μm continuous range optical height measurement sensor used to characterize a 2.3 μm height Indium Phosphide twin square optical waveguide chip.

Original languageEnglish
Title of host publicationEnabling Photonics Technologies for Defense, Security, and Aerospace Applications III
DOIs
Publication statusPublished - 2007
Externally publishedYes
EventEnabling Photonics Technologies for Defense, Security, and Aerospace Applications III - Orlando, FL, United States
Duration: 9 Apr 200710 Apr 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6572
ISSN (Print)0277-786X

Conference

ConferenceEnabling Photonics Technologies for Defense, Security, and Aerospace Applications III
Country/TerritoryUnited States
CityOrlando, FL
Period9/04/0710/04/07

Keywords

  • Confocal microscopy
  • Height measurements
  • Instrumentation, measurement, and metrology
  • Liquid crystals
  • Scanning microscopy

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