Novel parameter extraction techniques for low-voltage, low-power technologies

S. Minehane; K. G. McCarthy; P. O'Sullivan; A. Mathewson

Novel parameter extraction techniques for low-voltage, low-power technologies

S. Minehane
, K. G. McCarthy
, P. O'Sullivan
, A. Mathewson

School of Engineering and Architecture

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

Abstract

This paper outlines the development of novel quick parameter extraction techniques which provide geometry-independent BSIM3v3.2 parameter sets. 29 parameters' are extracted from only 97 measured 1-V data points. A comparison of measured and fitted device data for sample nMOSFET and pMOSFET devices from a O.18fμm CMOS process is presented.

Original language	English
Title of host publication	ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference
Editors	R.P. Mertens, H. Grunbacher, H.E. Maes, G. Declerck
Publisher	IEEE Computer Society
Pages	452-455
Number of pages	4
ISBN (Electronic)	2863322451, 9782863322451
Publication status	Published - 1999
Event	29th European Solid-State Device Research Conference, ESSDERC 1999 - Leuven, Belgium Duration: 13 Sep 1999 → 15 Sep 1999

Publication series

Name	European Solid-State Device Research Conference
Volume	13-15 Sept. 1999
ISSN (Print)	1930-8876

Conference

Conference	29th European Solid-State Device Research Conference, ESSDERC 1999
Country/Territory	Belgium
City	Leuven
Period	13/09/99 → 15/09/99

Cite this

Minehane, S., McCarthy, K. G., O'Sullivan, P., & Mathewson, A. (1999). Novel parameter extraction techniques for low-voltage, low-power technologies. In R. P. Mertens, H. Grunbacher, H. E. Maes, & G. Declerck (Eds.), ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference (pp. 452-455). Article 1505537 (European Solid-State Device Research Conference; Vol. 13-15 Sept. 1999). IEEE Computer Society.

Minehane, S. ; McCarthy, K. G. ; O'Sullivan, P. et al. / Novel parameter extraction techniques for low-voltage, low-power technologies. ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. editor / R.P. Mertens ; H. Grunbacher ; H.E. Maes ; G. Declerck. IEEE Computer Society, 1999. pp. 452-455 (European Solid-State Device Research Conference).

@inproceedings{3bf56a26a76f4fbd88d6a319f2c47cc5,

title = "Novel parameter extraction techniques for low-voltage, low-power technologies",

abstract = "This paper outlines the development of novel quick parameter extraction techniques which provide geometry-independent BSIM3v3.2 parameter sets. 29 parameters' are extracted from only 97 measured 1-V data points. A comparison of measured and fitted device data for sample nMOSFET and pMOSFET devices from a O.18fμm CMOS process is presented.",

author = "S. Minehane and McCarthy, \{K. G.\} and P. O'Sullivan and A. Mathewson",

year = "1999",

language = "English",

series = "European Solid-State Device Research Conference",

publisher = "IEEE Computer Society",

pages = "452--455",

editor = "R.P. Mertens and H. Grunbacher and H.E. Maes and G. Declerck",

booktitle = "ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference",

address = "United States",

note = "29th European Solid-State Device Research Conference, ESSDERC 1999 ; Conference date: 13-09-1999 Through 15-09-1999",

}

Minehane, S, McCarthy, KG, O'Sullivan, P & Mathewson, A 1999, Novel parameter extraction techniques for low-voltage, low-power technologies. in RP Mertens, H Grunbacher, HE Maes & G Declerck (eds), ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference., 1505537, European Solid-State Device Research Conference, vol. 13-15 Sept. 1999, IEEE Computer Society, pp. 452-455, 29th European Solid-State Device Research Conference, ESSDERC 1999, Leuven, Belgium, 13/09/99.

Novel parameter extraction techniques for low-voltage, low-power technologies. / Minehane, S.; McCarthy, K. G.; O'Sullivan, P. et al.
ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. ed. / R.P. Mertens; H. Grunbacher; H.E. Maes; G. Declerck. IEEE Computer Society, 1999. p. 452-455 1505537 (European Solid-State Device Research Conference; Vol. 13-15 Sept. 1999).

Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review

TY - GEN

T1 - Novel parameter extraction techniques for low-voltage, low-power technologies

AU - Minehane, S.

AU - McCarthy, K. G.

AU - O'Sullivan, P.

AU - Mathewson, A.

PY - 1999

Y1 - 1999

N2 - This paper outlines the development of novel quick parameter extraction techniques which provide geometry-independent BSIM3v3.2 parameter sets. 29 parameters' are extracted from only 97 measured 1-V data points. A comparison of measured and fitted device data for sample nMOSFET and pMOSFET devices from a O.18fμm CMOS process is presented.

AB - This paper outlines the development of novel quick parameter extraction techniques which provide geometry-independent BSIM3v3.2 parameter sets. 29 parameters' are extracted from only 97 measured 1-V data points. A comparison of measured and fitted device data for sample nMOSFET and pMOSFET devices from a O.18fμm CMOS process is presented.

UR - https://www.scopus.com/pages/publications/84907887776

M3 - Conference proceeding

AN - SCOPUS:84907887776

T3 - European Solid-State Device Research Conference

SP - 452

EP - 455

BT - ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference

A2 - Mertens, R.P.

A2 - Grunbacher, H.

A2 - Maes, H.E.

A2 - Declerck, G.

PB - IEEE Computer Society

T2 - 29th European Solid-State Device Research Conference, ESSDERC 1999

Y2 - 13 September 1999 through 15 September 1999

ER -

Minehane S, McCarthy KG, O'Sullivan P, Mathewson A. Novel parameter extraction techniques for low-voltage, low-power technologies. In Mertens RP, Grunbacher H, Maes HE, Declerck G, editors, ESSDERC 1999 - Proceeding of the 29th European Solid-State Device Research Conference. IEEE Computer Society. 1999. p. 452-455. 1505537. (European Solid-State Device Research Conference).

Novel parameter extraction techniques for low-voltage, low-power technologies

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