Novel UV-assisted Rapid Thermal Annealing of Ferroelectric Materials

  • E. Lynch
  • , S. O'Brien
  • , P. V. Kelly
  • , H. Guillon
  • , L. Pardo
  • , R. Poyato
  • , A. González
  • , M. L. Calzada
  • , Igor Stolichnov

Research output: Chapter in Book/Report/Conference proceedingsChapterpeer-review

Abstract

This chapter presents a paper that describes a novel processing technique termed Ultra Violet Rapid Thermal Processing (UV-RTP), which is used for reduced temperature crystallization of ferroelectric thin-films. These materials are attracting major research interest in applications, such as pyroelectric sensors and micro-electromechanical systems because of their superior properties. Furnaces and RTP units find a wide range of application in semi-conductor manufacturing, such as oxidation, nitridation, annealing, and glass-reflow processing. Although conventional furnace technology has been established for much longer than RTP technology, RTP has a number of attractive features, which offer advantages over furnace processing. There is no time delay in heating and cooling in RTP. Additionally, the lower-thermal budget of an RTP system means that even a single-wafer system can have competitive throughput. It is the associated rapid temperature ramp that is of most interest in the area of ferroelectric materials development. Ferroelectrics are materials that have a spontaneous electric polarisation, the direction of which can be reversed by the application of an external electric field. They display dielectric properties, along with piezoelectric and pyroelectric properties.

Original languageEnglish
Title of host publicationRapid Thermal Processing for Future Semiconductor Devices
PublisherElsevier B.V.
Pages75-82
Number of pages8
ISBN (Print)9780444513397
DOIs
Publication statusPublished - Apr 2003

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