On the impact of Gate field-plate length and barrier layer thickness on TDDB lifetime of GaN-on-Si MISHEMT devices for RF/5G/mm-Wave applications
- Chien Yu Lin
- , Vamsi Putcha
- , Alireza Alian
- , Niamh Waldron
- , Dimitri Linten
- , Nadine Collaert
- , Ting Chang Chang
- Sun Yat-Sen University
- IMEC
Research output: Chapter in Book/Report/Conference proceedings › Conference proceeding › peer-review