Optical substrate thickness measurement system using hybrid fiber-freespace optics and selective wavelength interferometry

Engineering

• Interferometry 100%
• Measurement System 100%
• Fiber Optics 50%
• Optical Power 50%
• Single Mode Fibers 50%
• Optical Quality 50%
• Optical Source 50%
• Optical Design 50%
• Confocal Imaging 50%
• Material Dispersion 50%
• Optical Fiber Type 50%

Physics

• Interferometry 100%
• Optics 100%
• Silicon Carbide 100%
• Optical Power 50%
• Fiber Optic 50%
• Tunable Laser 50%
• Data Acquisition 50%
• Optical Fiber Type 50%
• Etalons 50%