Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films

TY - GEN

T1 - Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films

AU - Trinh, Ngoc Le

AU - Kim, Wonjoong

AU - Lee, Minhyeok

AU - Gu, Bonwook

AU - Thi, Sanh Vo

AU - Liu, Ji

AU - Nolan, Michael

AU - Kim, Hyun-Mi

AU - Kim, Hyeongkeun

AU - Kim, Joondong

AU - Kang, Youngho

AU - Lee, Han-Bo-Ram

PY - 2025/10/30

Y1 - 2025/10/30

UR - https://doi.org/10.26434/chemrxiv-2025-5x13x

U2 - 10.26434/chemrxiv-2025-5x13x

DO - 10.26434/chemrxiv-2025-5x13x

M3 - Other output

ER -