| Original language | Undefined/Unknown |
|---|---|
| DOIs | |
| Publication status | Published - 30 Oct 2025 |
Overcoming the Critical Thickness Limit: Interfacial Control of Crystallization Pathways in Atomic-Scale Dielectric Thin Films
- Ngoc Le Trinh
- , Wonjoong Kim
- , Minhyeok Lee
- , Bonwook Gu
- , Sanh Vo Thi
- , Ji Liu
- , Michael Nolan
- , Hyun-Mi Kim
- , Hyeongkeun Kim
- , Joondong Kim
- , Youngho Kang
- , Han-Bo-Ram Lee
Research output: Other output