Abstract
P-substrate AlGaInAs/InP lasers are enabled using an internal carbon-doped layer to block Zn-diffusion. These inverted lasers are developed for the aim of further monolithic vertical integration with passive or active material, which would allow full system on-chip integration. The lasers emit at 1.5 μm making them ideal for telecommunication applications. Different p-substrate laser designs were grown to quantify the effect the carbon doped layer had on blocking Zn p-dopants diffusion, which permits the long growths necessary for vertical integration. Current, voltage, and capacitance measurements were used to examine the different laser designs, proving that Zn p-dopant diffusion is responsible for p-substrate laser failure.
| Original language | English |
|---|---|
| Pages (from-to) | 2363-2367 |
| Number of pages | 5 |
| Journal | Microwave and Optical Technology Letters |
| Volume | 60 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Oct 2018 |
Keywords
- indium phosphide
- lasers
- optoelectronic devices
- photonic integrated circuits
- semiconductor
- semiconductor epitaxial layers