P-substrate InP-based 1.5 μm lasers using an internal carbon-doped layer to block p-dopant diffusion

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Abstract

P-substrate AlGaInAs/InP lasers are enabled using an internal carbon-doped layer to block Zn-diffusion. These inverted lasers are developed for the aim of further monolithic vertical integration with passive or active material, which would allow full system on-chip integration. The lasers emit at 1.5 μm making them ideal for telecommunication applications. Different p-substrate laser designs were grown to quantify the effect the carbon doped layer had on blocking Zn p-dopants diffusion, which permits the long growths necessary for vertical integration. Current, voltage, and capacitance measurements were used to examine the different laser designs, proving that Zn p-dopant diffusion is responsible for p-substrate laser failure.

Original languageEnglish
Pages (from-to)2363-2367
Number of pages5
JournalMicrowave and Optical Technology Letters
Volume60
Issue number10
DOIs
Publication statusPublished - Oct 2018

Keywords

  • indium phosphide
  • lasers
  • optoelectronic devices
  • photonic integrated circuits
  • semiconductor
  • semiconductor epitaxial layers

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