TY - GEN
T1 - Parallel artefact rejection for epileptiform activity detection in routine EEG
AU - Kelleher, D.
AU - Temko, A.
AU - Orregan, S.
AU - Nash, D.
AU - McNamara, B.
AU - Costello, D.
AU - Marnane, W. P.
PY - 2011
Y1 - 2011
N2 - The EEG signal is very often contaminated by electrical activity external to the brain. These artefacts make the accurate detection of epileptiform activity more difficult. A scheme developed to improve the detection of these artefacts (and hence epileptiform event detection) is introduced. A structure of parallel Support Vector Machine classifiers is assembled, one classifier tuned to perform the identification of epileptiform activity, the remainder trained for the detection of ocular and movement-related artefacts. This strategy enables an absolute reduction in false detection rate of 21.6% with the constraint of ensuring all epileptic events are recognized. Such a scheme is desirable given that sections of data which are heavily contaminated with artefact need not be excluded from analysis.
AB - The EEG signal is very often contaminated by electrical activity external to the brain. These artefacts make the accurate detection of epileptiform activity more difficult. A scheme developed to improve the detection of these artefacts (and hence epileptiform event detection) is introduced. A structure of parallel Support Vector Machine classifiers is assembled, one classifier tuned to perform the identification of epileptiform activity, the remainder trained for the detection of ocular and movement-related artefacts. This strategy enables an absolute reduction in false detection rate of 21.6% with the constraint of ensuring all epileptic events are recognized. Such a scheme is desirable given that sections of data which are heavily contaminated with artefact need not be excluded from analysis.
UR - https://www.scopus.com/pages/publications/84861658883
U2 - 10.1109/IEMBS.2011.6091961
DO - 10.1109/IEMBS.2011.6091961
M3 - Conference proceeding
C2 - 22256185
AN - SCOPUS:84861658883
SN - 9781424441211
T3 - Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS
SP - 7953
EP - 7956
BT - 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS 2011
T2 - 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS 2011
Y2 - 30 August 2011 through 3 September 2011
ER -